Defect analysis of CZTS thin films using photoluminescence technique Conference Paper


Author(s): Poornima, N.; Rajeshmon V G; Kartha, C.S.; Vijayakumar, K.P
Title: Defect analysis of CZTS thin films using photoluminescence technique
Keywords: Photoluminescence; CZTS; Defects
Conference Title: AIP Conference Proceedings
Conference Location: 1512
Publisher: Unknown  
Date Published: 2013
Start Page: 464
End Page: 465
DOI/URL:
Notes: --- - "Photoluminescence (PL) technique was used to identify defect levels in Copper Zinc Tin Sulphide (CZTS) thin films deposited using Chemical Spray Pyrolysis (CSP). Films were deposited for different Cu:Zn:Sn:S ratios. An emission was observed at 0.8 eV. It was monitored from 15K to room temperature and activation energy was calculated. Excitation power dependent studies were done to analyze the type of transition. \xC2\xA9 2013 American Institute of Physics." - <p>Cited By :2</p> - "<p>Export Date: 11 February 2015</p>"
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