XPS depth profile study of sprayed CZTS thin films Conference Paper


Author(s): Deepu D R; Rajeshmon V G; Kartha, C.S.; Vijayakumar, K.P
Title: XPS depth profile study of sprayed CZTS thin films
Keywords: X-ray photoelectron spectroscopy; CZTS; Depth profiling
Conference Title: AIP Conference Proceedings
Conference Location: 1591
Publisher: Unknown  
Date Published: 2014
Start Page: 1666
End Page: 1668
DOI/URL:
Notes: --- - "XPS depth profile studies were carried out to analyze the composition and stoichiometry of sprayed CZTS thin films giving an efficiency of 1.85% in CZTS based thin film solar cell. Surface layers were nearly stoichiometric (Cu:Zn:Sn:S=2:1:1:4) whereas the inner layers were found to be Copper rich in composition making it electrically more conductive. \xC2\xA9 2014 AIP Publishing LLC." - "<p>Export Date: 11 February 2015</p>"
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